致茂電子 Chroma ATE Inc.

應用指南
應用指南
關鍵字:
電力電子測試解決方案
直流電子負載
1. 如何透過Ethernet to RS-232去控制儀器 2. 如何透過Wireless LAN to RS-232去控制儀器
交流電源供應器
1. 如何透過Ethernet to RS-232去控制儀器 2. 如何透過Wireless LAN to RS-232去控制儀器
直流電源供應器
1. 15 通道電池模組充放電測試軟體 2. Chroma Solar Array Simulator 智能主從控制應用說明 3. 如何使用SAS模式測試光伏逆變器的靜態MPPT效率及轉換效率 4. 如何讓Chroma Solar Array Simulator輸出Shadow I-V curve
電池測試及自動化解決方案
電池包生產線測試
1. 15 通道電池模組充放電測試軟體
半導體/IC測試解決方案
VLSI測試系統
1. "64 Pins的Coaxial Cable不能接在3360P2 CABLE MOUNT LOAD BOARD上的TBUS及LXPG2/STDPS的Connector(牛角)位置。" 2. "CONTACT TEST" utility for prober setup 3. "Descript the limitation of Craft 3360N to prevent error usage 4. "How to programming Reduced Swing Differential Signaling (RSDS) function in Chroma 3360/3520." 5. "STPHI接收訊號之雜訊(Noise)過大時,TTL通訊品質的影響。" 6. "The limitation of LCD pin pattern convert rate( for novatek use only) " 7. "在Multi-Sites的情況下,如何讓同一根Pin的任意多個Sites同時作用? 或是在定義好的PIN_GROUP中,只讓任意Pins作用?" 8. "避免小卡片接近禁區有進入禁區的可能性" 9. [ALPG] Example of several well-know, traditional memory test. 10. “IMATCH” 的sample 實驗 11. 3360P for only executing O/S Test have some hardware circuit modification. 12. AWI 弦波相位不連續的現象。 13. Changes about TTL model: 1 EOT. 14. Chroma3503 for SC312 轉接板,trace impedance test and User relay control signal check 15. Contact Test Function Generator 16. Contect prober card for B_type loadboard 17. CRAFT scope waveform與示波器所measured waveform之差異說明 18. Craft statement “SOCKET_SET”― execute test plan on one specific SITE in an multi_site environment 19. Craft statement ”PARAL_INC” ― automatic allocation of PMU to a PIN_GROUP 20. CRAFT如何輸出測試結果(TDO files / STDF files / Summary Report) ? 21. Delay error in ADC動態測試 22. How to debug scan function? 23. How to declare relay board signal of slot3 in dec file 24. How to do the trigger delay timing when use LCDT in 3520? 25. How to execute MIB Diagnosis 26. How to program DBL mode (MUX mode) pattern 27. How to program the SET_LEVEL and MARKN for a better solution of the multi-site test time? 28. How to transfer 350x NORM-mode pattern to DBL-mode(MUX-mode) pattern 29. How to transfer G5510 declaration file (*.h) and main rogramfile (*.t) to 3500 declaration file (*.dec) and test plan program (*.pln) 30. How to transfer G5510 test pattern (*.spt) to 3500 pattern (*.pat)? 31. How to transfer SC312 declaration file (*.dif) to 3503 declaration file (*.dec) 32. How to transfer SC312 main program (*.tpf) to 3503 plan program (*.pln) 33. How to Transfer SC312 test pattern (*.avf) to 3503 pattern (*.pat) 34. How to transfer TS6700 declaration file (*.ddf) to 3500 declaration file (*.dec) 35. How to transfer TS6700 main program (*.tdl) to 3500 plan program (*.pln) 36. How to transfer TS6700 pattren (*.pf) to 3500 (*.pat) 37. How to Transfer V50 test pattern (*.PTN or *.SD) to 3360 pattern (*.pat) 38. How to Transfer V50 test program (.prg and .tim) to 3360 plan program (*.pln) 39. How to transfer V7100 main program (*C) to 3360 plan program (*.pln) 40. How to transfer V7100 pattren (*.Q7) to 3360 (*.pat) 41. How to use “FAIL_REJUDGE” in Chroma C350X series tester system ? 42. How to use “READ_PROBER_XY" 43. How to use POWER_DOWN_FAIL_SITE” in Chroma 350X series test system. 44. How to use the DPS/PREF UIPP mode. 45. How to use the raw data catch statement. 46. How to use Utility of Op-BOX? 47. How to use Window strobe in Chroma 350X series tester? 48. Identify CRAFT version 49. Introduce how to use ALPG (including *.DEC, *.PAT, *.PLN). 50. JCONT fail 時 CRAFT的反應 51. LCD board Settling level characteristic 52. Logic_Waveform setup 53. MEAS_LCD_DGT and MEAS_LCD_DGT_n return data arrangement . 54. Multi-Site program coding notices 55. RZ/RO format 之marker DT0與DT1在使用上的限制 56. Select the ROM code to be compiled and loaded in the START_UP item. 57. SOCKET_INC Statement hardware action modifies (3500 CRAFT 2.0.4 Patch 3) 58. The 2X/3X/4X/6X Timing and Marker limitation. 59. The difference between Chroma3500 and Chroma3502 60. The difference between Type-B Pogo Ring Tower Load Board Layout of version-3 and version-4 61. The instruction of scan function 62. The notice of using “FREE RUN CLK(FCLK)”. 63. The Notices of Pogo ring tower load board of Version-3 64. Timing restriction of the micro instruction “IMATCH” 65. Type-B Pogo Ring Tower Load Board Layout of version-3 66. Type-B Pogo Ring Tower Load Board Layout of version-4 67. Type-C Pogo Ring Tower Load Board layout of version-A 68. Universal Socket Dut Board Blank 69. Use VECTOR_EXTRACT statement to get learn mode pattern from different ROM 70. When use SPM memory the limitation of micro-instruction JMP、JSR、JNZi(i=0~3). 71. 使用Capture memory超過其log memory深度所造成的問題。 72. 使用外部電路來克服 capture Memory 最大64K使用限制
SoC測試系統
1. 3600 Get Code 2. 3600 Multi Site DPS level setting 3. 3600 Waveform Example 4. 3600 切換版本注意事項 5. 3650 Function Key 6. 3650 Pin MUX 7. 3650 Waveform Example 8. 3650 X2 mode 9. 36XX Function Key setting 10. AC Test Function 11. Active Load 的know how 與正確操作方法 12. Change Pattern On Fly on Chroma 3650 13. CPLD Download 14. CPLD Download 15. CPLD Download 16. Create the program server on the 3650 17. Datalog Tool 中FC PIN 與FC PATTERN 執行動作的差異 18. DPS And PMU Power Sequence 19. DPS Gang 20. Float Pins 的know how 與正確操作方式 21. Get Wafer XY Position 22. Get Wafer XY Position 23. How to add property on OCI 24. How to Call EOL-EOW 25. How to call the shmoo tool in plan program 26. How to code Shmoo function 27. HOW TO FIXED SQM FULL ERROR 28. How to use Shmoo auto-running functions 29. How to utilize 3650’s capture memory 30. judge_i_pmu 的M_mode 與Mode 參數說明 31. judge_pat 的Im_mode 參數使用方式 32. Match Function Control 33. Match Function Control 34. OSC Measurement 35. OSC Measurement 36. Pin to Pin short 37. Pin to Pin short 38. pin_inc Function 39. PinGroup Definition 40. Power Reset 41. Power Sequence 對IC test 的影響與Power Sequence 的設定方式 42. Power Sequence 對IC test 的影響與Power Sequence 的設定方式 43. RTWC&RTWC LUT Index 44. RTWC&RTWC LUT Index 45. Sequence after Binning Stop 46. Set_Load_Low function 47. Switch Test Flow By OCI Process 48. 如何在 3650 上外掛External Library 49. 如何利用 3650 來持續force 電壓或電流並進行量測 50. 利用 VIN channel 作為Power source
PXI 量測解決方案
一般PXI 設備
1. Guarding:Enhance DC Transmission Speed for very Low-current Measurement 2. Guarding:Guard Shield used for Low Current (nano-Amp) Measurement 3. Using a Source Measure Unit as a Device Power Supply for Semiconductor Testing